The Belle II experiment at the SuperKEKB asymmetric energy e+e- collider in KEK, Japan will operate at an instantaneous luminosity 40 times larger than that of its predecessor, Belle. It is built with an aim of collecting a huge amount of data (50 ab-1 by 2025) for precise CP violation measurements and new physics search. Thus, we need an accurate vertex determination and reconstruction of low momentum tracks which will be achieved with the help of vertex detector (VXD). The Belle II VXD consists of two layers of DEPFET pixels ('Pixel Detector') and four layers of double-sided silicon microstrip sensors ('Silicon Vertex Detector'), assembled over carbon fibre ribs. In this paper, we discuss about the Belle II Silicon Vertex Detector, especially its design and key features; we also present its module ('ladder') assembly and testing procedures.

Belle II silicon vertex detector / Dutta, D.; Adamczyk, K.; Aihara, H.; Angelini, C.; Aziz, T.; Babu, V.; Bacher, S.; Bahinipati, S.; Barberio, E.; Baroncelli, Ti.; Baroncelli, To.; Basith, A. K.; Batignani, G.; Bauer, A.; Behera, P. K.; Bergauer, T.; Bettarini, S.; Bhuyan, B.; Bilka, T.; Bosi, F.; Bosisio, L.; Bozek, A.; Buchsteiner, F.; Bulla, L.; Caria, G.; Casarosa, G.; Ceccanti, M.; Cervenkov, D.; Chendvankar, S. R.; Dash, N.; De Pietro, G.; Divekar, S. T.; Doležal, Z.; Forti, F.; Friedl, M.; Hara, K.; Higuchi, T.; Horiguchi, T.; Irmler, C.; Ishikawa, A.; Jeon, H. B.; Joo, C.; Kandra, J.; Kambara, N.; Kang, K. H.; Kawasaki, T.; Kodyš, P.; Kohriki, T.; Koike, S.; Kolwalkar, M. M.; Kumar, R.; Kun, W.; Kvasnicka, P.; La Licata, C.; Lanceri, L.; Lettenbicher, J.; Libby, J.; Lueck, T.; Maki, M.; Mammini, P.; Mayekar, S. N.; Mohanty, G. B.; Mohanty, S.; Morii, T.; Nakamura, K. R.; Natkaniec, Z.; Onuki, Y.; Ostrowicz, W.; Paladino, A.; Paoloni, E.; Park, H.; Pilo, F.; Profeti, A.; Rashevskaya, I.; Rao, K. K.; Rizzo, G.; Resmi, P. K.; Rozanska, M.; Sasaki, J.; Sato, N.; Schultschik, S.; Schwanda, C.; Seino, Y.; Shimizu, N.; Stypula, J.; Suzuki, J.; Tanaka, S.; Taylor, G. N.; Thalmeier, R.; Thomas, R.; Tsuboyama, T.; Uozumi, S.; Urquijo, P.; Vitale, L.; Watanuki, S.; Watanabe, M.; Watson, I. J.; Webb, J.; Wiechczynski, J.; Williams, S.; Wrkner, B.; Yamamoto, H.; Yin, H.; Yoshinobu, T.; Zani, L.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 12:2(2017), pp. C02074-C02074. [10.1088/1748-0221/12/02/C02074]

Belle II silicon vertex detector

Forti, F.;Lanceri, L.;Paladino, A.;
2017

Abstract

The Belle II experiment at the SuperKEKB asymmetric energy e+e- collider in KEK, Japan will operate at an instantaneous luminosity 40 times larger than that of its predecessor, Belle. It is built with an aim of collecting a huge amount of data (50 ab-1 by 2025) for precise CP violation measurements and new physics search. Thus, we need an accurate vertex determination and reconstruction of low momentum tracks which will be achieved with the help of vertex detector (VXD). The Belle II VXD consists of two layers of DEPFET pixels ('Pixel Detector') and four layers of double-sided silicon microstrip sensors ('Silicon Vertex Detector'), assembled over carbon fibre ribs. In this paper, we discuss about the Belle II Silicon Vertex Detector, especially its design and key features; we also present its module ('ladder') assembly and testing procedures.
2017
Particle tracking detectors; Particle tracking detectors (Solid-state detectors); Si microstrip and pad detectors; Solid state detectors; Instrumentation; Mathematical Physics
01 Pubblicazione su rivista::01a Articolo in rivista
Belle II silicon vertex detector / Dutta, D.; Adamczyk, K.; Aihara, H.; Angelini, C.; Aziz, T.; Babu, V.; Bacher, S.; Bahinipati, S.; Barberio, E.; Baroncelli, Ti.; Baroncelli, To.; Basith, A. K.; Batignani, G.; Bauer, A.; Behera, P. K.; Bergauer, T.; Bettarini, S.; Bhuyan, B.; Bilka, T.; Bosi, F.; Bosisio, L.; Bozek, A.; Buchsteiner, F.; Bulla, L.; Caria, G.; Casarosa, G.; Ceccanti, M.; Cervenkov, D.; Chendvankar, S. R.; Dash, N.; De Pietro, G.; Divekar, S. T.; Doležal, Z.; Forti, F.; Friedl, M.; Hara, K.; Higuchi, T.; Horiguchi, T.; Irmler, C.; Ishikawa, A.; Jeon, H. B.; Joo, C.; Kandra, J.; Kambara, N.; Kang, K. H.; Kawasaki, T.; Kodyš, P.; Kohriki, T.; Koike, S.; Kolwalkar, M. M.; Kumar, R.; Kun, W.; Kvasnicka, P.; La Licata, C.; Lanceri, L.; Lettenbicher, J.; Libby, J.; Lueck, T.; Maki, M.; Mammini, P.; Mayekar, S. N.; Mohanty, G. B.; Mohanty, S.; Morii, T.; Nakamura, K. R.; Natkaniec, Z.; Onuki, Y.; Ostrowicz, W.; Paladino, A.; Paoloni, E.; Park, H.; Pilo, F.; Profeti, A.; Rashevskaya, I.; Rao, K. K.; Rizzo, G.; Resmi, P. K.; Rozanska, M.; Sasaki, J.; Sato, N.; Schultschik, S.; Schwanda, C.; Seino, Y.; Shimizu, N.; Stypula, J.; Suzuki, J.; Tanaka, S.; Taylor, G. N.; Thalmeier, R.; Thomas, R.; Tsuboyama, T.; Uozumi, S.; Urquijo, P.; Vitale, L.; Watanuki, S.; Watanabe, M.; Watson, I. J.; Webb, J.; Wiechczynski, J.; Williams, S.; Wrkner, B.; Yamamoto, H.; Yin, H.; Yoshinobu, T.; Zani, L.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 12:2(2017), pp. C02074-C02074. [10.1088/1748-0221/12/02/C02074]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1200395
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